3

Physical mechanism of progressive breakdown in gate oxides

Year:
2014
Language:
english
File:
PDF, 982 KB
english, 2014
7

4502209 Forming low-resistance contact to silicon

Year:
1985
Language:
english
File:
PDF, 172 KB
english, 1985
25

interfaces

Year:
2011
Language:
english
File:
PDF, 620 KB
english, 2011
36

In-Situ Characterizarion of Interfaces-Induced Resistivity in Nanometric Dimensions

Year:
2006
Language:
english
File:
PDF, 285 KB
english, 2006